Episode Synopsis "Lecture 10: Interface Damage & Negative Bias Temperature Instability"

Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions

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More episodes of the podcast [Audio] Nanostructured Electronic Devices: Percolation and Reliability

• Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells
• Lecture 4: Stick Percolation and Nanonet Electronics
• Lecture 7: On Reliability and Randomness in Electronic Devices
• Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae
• Lecture 10: Interface Damage & Negative Bias Temperature Instability
• Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown
• Lecture 2: Threshold, Islands, and Fractals
• Lecture 3: Electrical Conduction in Percolative Systems
• Lecture 9: Breakdown in Thick Dielectrics
• Lecture 1: Percolation and Reliability of Electronic Devices