Lecture 10: Interface Damage & Negative Bias Temperature Instability

Lecture 10: Interface Damage & Negative Bias Temperature Instability

[Audio] Nanostructured Electronic Devices: Percolation and Reliability

02/02/2010 10:16PM

Episode Synopsis "Lecture 10: Interface Damage & Negative Bias Temperature Instability"

Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions

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